Self-configuring test sytstem

Details Self-configuring test sytstem Self-configuring test sytstem

1993-05-27

1995-07-25

Kriess, Kevin A.

Boots, shoes, and leggings

3642301, 3642303, 364DIG1, G06F 944

Patent

active

054370302

ABSTRACT:
A sensor test system is disclosed for testing the operation of infrared detector modules designed to be placed in earth orbit. The system includes an optical scene test generator (OSTG) for generating a scene representative of the earth's surface as seen from a satellites, and an object moving in relation to the earth's surface. Sensor chamber is disposed adjacent the OSTG for storing a detector module to be tested. Detector module is efficient within the sensor chamber to expose detector elements to the optical scene generated by the OSTG.

REFERENCES:
patent: 4315315 (1982-02-01), Kossiakoff
patent: 4734854 (1988-03-01), Afshar
patent: 4748573 (1988-05-01), Sarandrea et al.
patent: 4809170 (1989-02-01), Leblang et al.
patent: 4925311 (1990-05-01), Neches et al.
patent: 4949290 (1990-08-01), Pike et al.
patent: 4951192 (1990-08-01), Chase, Jr. et al.
patent: 4974160 (1990-11-01), Bone et al.
patent: 5036479 (1991-07-01), Prednis et al.
patent: 5057996 (1991-10-01), Cutler et al.
patent: 5075847 (1991-12-01), Fromme
Alfs et. al., "The Karl/Karate System-Automatic Test Pattern Generation on RT Level Descriptions", IEEE Comp. Soc., Sep. 1988, pp. 230-235.
P. F. Pickel, "Automated Development of Test Program Sets for Analog Circuit Modules", IEEE Autotestcon '88 Symp., Oct. 1988, pp. 261-265.
Lewoc et. al., "CADEL: CAD for Real Time Control System Software", IEE Int. Conf. on Software Eng. for Real Time Sys., Sep. 1989, pp. 250-254.
G. Taylor, "UUT and Model Data for Multiple Test-Techniques", IEEE Comp. Soc., Apr. 1989, pp. 229-237.
Narayanan et. al., "A Parallel Algorithm for Fault Simulation on the Connection Machine", IEEE Comp. Soc., Sep. 1988, pp. 89-93.
Malek et. al., "Topological Testing", IEEE Comp. Soc., Aug. 1989, pp. 103-110.
Yates, "METS meets the F-15E Supportability Challenge", Annual Reliability and Maintainability Symp., Jan. 1988, pp. 280-282.

Affiliated with

Also associated with

Rating

Self-configuring test sytstem does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Self-configuring test sytstem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Self-configuring test sytstem will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-746918