Self-compensating X-ray or .gamma.-ray thickness gauge

Details Self-compensating X-ray or .gamma.-ray thickness gauge Self-compensating X-ray or .gamma.-ray thickness gauge

1976-07-02

1977-09-06

Willis, Davis L.

Radiant energy

Coded record and readers; invisible radiant energy type

250358R, G01N 2320, G01N 2300

Patent

active

040470296

ABSTRACT:
A gauge for determining the mass per unit area, or alternatively the thickness of sheet material by measuring the attenuation, as well as backscatter, of an X-ray beam or the like, while continuously taking into account deviations and changes in localized material composition, insofar as these have an effect on the transmission coefficient of the beam. Electrical signals representing these deviations are combined with calibration data for given material nominal properties, i.e., nominal composition. The resultant and output signal represents the mass per unit area or thickness.

REFERENCES:
patent: 3210545 (1965-10-01), Barnett
patent: 3569708 (1971-03-01), Weinbaum et al.

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