Self-compensating measurement system

Details Self-compensating measurement system Self-compensating measurement system

1979-01-31

1981-02-24

Atkinson, Charles E.

Boots, shoes, and leggings

364573, 364580, 324130, G01R 3500

Patent

active

042531551

ABSTRACT:
Compensation for errors in an amplitude conversion system caused by inaccuracies in and nonlinearities of system circuit components is realized by employing a self-compensation process in an amplitude measurement system (FIG. 1). In one embodiment first and second reference signals (from 111) are controllably supplied (under control of 105 via A1, A2SW1, SW2, 108, 112, 113 and 103) to a RMS-LOG converter circuit (104) to obtain a measure of the amplitudes of the reference signals (TA, TB) and convert the amplitudes into pulse signals. The pulse signals are supplied to a control circuit (105) for conversion into digital form and storage as reference numbers for future use. A test signal supplied from a remote location over a facility under evaluation is supplied (via T, R, 101, 102, 103) to the RMS-LOG converter (104) where the test signal amplitude (TMEAS) is measured and converted into a pulse signal. In turn, the test pulse signal (TMEAS) is supplied to the control circuit (105), converted into digital form and used in conjunction with the prior stored reference numbers (TA, TB) and prescribed constants in a first prescribed compensation process to generate an output signal (TCORR) representative of the test signal amplitude (TMEAS) compensated for measurement system errors.
In another embodiment at least first, second and third reference signals (TA, TB, TC) are employed in conjunction with a test signal measurement (TMEAS) in a second prescribed compensation process to compensate test signal measurements for high order deviations from linearity.

REFERENCES:
patent: 3541320 (1970-11-01), Beall
patent: 3842247 (1974-10-01), Anderson
patent: 3939332 (1976-02-01), Williams, Jr. et al.
patent: 4031630 (1977-06-01), Fowler
patent: 4088951 (1978-05-01), Fletcher et al.
patent: 4150433 (1979-04-01), Kaniel
patent: 4161782 (1979-07-01), McCracken
EDN-Software Calibration Reduces A/D Errors by F. Gutman, Jan. 5, 1979, pp. 58-62.

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