Self-checking memory cell array apparatus

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G06F 1100

Patent

active

051289474

ABSTRACT:
A totally self-checking memory cell array apparatus (30) has an array (31) of memory cells (32) selectively addressed by row and column decoders (33, 35) which receive unidirectional error detecting code signals as address inputs (34, 36). Data, as a multiple bit data word (A, B, C.sub.1, C.sub.2), is stored in the array (31) in unidirectional error detecting code form. Cells in each row (1-8) of the array have two separate row select connection lines (45 and 45a) for coupling the cell to data and data complement (46, 46*) connections. Error detection circuits (44, 47) are provided which determine errors by comparing the data and data complement lines for each data bit read out of the array and for detecting when multiple bit data words read out of the array are not coded in a unidirectional error detecting code format. The above apparatus provides error indications in case of any unidirectional errors in the row or column input address signals or the row or column decoders, or any unidirectional error corruption of the data stored in the memory cell array. This is achieved without completely duplicating each memory cell in the array and all row and column decoder circuitry.

REFERENCES:
patent: 3289160 (1966-11-01), Carter et al.
patent: 3638184 (1972-01-01), Beuscher et al.
patent: 4362112 (1987-07-01), Stodola
patent: 4541076 (1985-09-01), Bowers et al.
patent: 4700346 (1987-10-01), Chandran et al.
patent: 4748627 (1988-05-01), Ohsawa
patent: 4757503 (1988-07-01), Hays et al.
patent: 4768193 (1988-08-01), Takemae
patent: 4785453 (1988-11-01), Chandran et al.
patent: 4837747 (1989-06-01), Dosaka et al.
patent: 4888772 (1989-12-01), Tanigawa
Neil Weste and Kamram Eshraghian, Principles of CMOS VSLI Design: A Systems Prospectus, Addison-Wesley Publishing Company Oct., 1985pp. 348-365 .COPYRGT.1985 by AT&T Bell Laboratories & Kamram Eshraghian.
Yoshihiro Tohma, "Coding Techniques in Fault Tolerant, Self-Checking and Fail-Safe Circuits": Chapter 4 of Fault Tolerant Computing: Theory and Techniques, vol. I, pp. 290-291, D. K. Pradhan, edition, .COPYRGT.1986 by Prentice-Hall.

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