Self-calibration technique for charge-coupled device imagers

Details Self-calibration technique for charge-coupled device imagers Self-calibration technique for charge-coupled device imagers

1980-05-13

1986-04-29

Munson, Gene M.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

357 24, 357 30, 307311, H01J 4014, H01L 2978, H01L 2714, H01L 3100

Patent

active

045859345

ABSTRACT:
A self-calibration technique which provides detector responsivity normalization for a charge-coupled device, hereinafter referred to as CCD, area imager. The CCD area imager is designed such that the detectors can be electrically decoupled from CCD multiplex register inputs. Calibration reference and gain normalization are provided by a pulsed light source and an analog divider circuit. This technique is applicable to both CCD visible imagers which are fabricated on an intrinsic semiconductor substrate and CCD infrared imagers which can be fabricated on an extrinsic or intrinsic substrate. The technique is applied to a visible imager for illustration of its self-calibration capability.

REFERENCES:
patent: 3020406 (1962-02-01), Whitney
patent: 3529895 (1970-09-01), Pincus
patent: 3883437 (1973-05-01), Nummedal et al.
patent: 3979587 (1976-09-01), Sternberg et al.
patent: 4142198 (1979-02-01), Finnila et al.
Barbe "Solid State Infrared Imaging", Nato Advanced Study Institute, Louvain-La-Neuve, Belgium (9/75), published in Jespers et al., Eds, Solid State Imaging Noordhoff, Leyden, Netherlands (1976), pp. 673-687.
Melen et al., IC Operational Amplifiers H. W. Sams, Indianapolis (1971), p. 83.

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