Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-05-22
2007-05-22
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
10908433
ABSTRACT:
A system for docking a device handler for an electrical device with a test head includes providing a device handler for holding the electrical device, the device handler having a plurality of docking pins. A test head having a plurality of docking modules mounted thereon is provided. The plurality of docking pins is aligned with the plurality of docking modules. The plurality of docking pins is inserted into the plurality of docking modules. The plurality of docking pins is secured in the plurality of docking modules in a docked position to connect the device handler to the test head.
REFERENCES:
patent: 6377062 (2002-04-01), Ramos et al.
patent: 2004/0018048 (2004-01-01), Sausen
Ishimaru Mikio
Nguyen Ha Tran
Nguyen Tung X.
Stats Chippac Ltd.
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