Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-07-26
2011-07-26
Malsawma, Lex (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S577000, C257SE31029, C257SE45001
Reexamination Certificate
active
07985959
ABSTRACT:
A phase change memory may include self-aligned polysilicon vertical bipolar junction transistors used as select devices. The bipolar junction transistors may be formed with double shallow trench isolation. For example, the emitters of each bipolar transistor may be defined by a first set of parallel trenches in one direction and a second set of parallel trenches in the opposite direction. In some embodiments, the formation of parasitic PNP transistors between adjacent emitters may be avoided.
REFERENCES:
patent: 2001/0002062 (2001-05-01), Noble et al.
patent: 2007/0254446 (2007-11-01), Pellizzer et al.
patent: 2008/0117667 (2008-05-01), Nirschl et al.
Benvenuti Augusto
Magistretti Michele
Mariani Marcello
Pellizzer Fabio
Intel Corporation
Malsawma Lex
Trop Pruner & Hu P.C.
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