Fishing – trapping – and vermin destroying
Patent
1986-08-22
1989-01-03
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 44, 437 48, 437 49, 437 52, 437200, 437984, H01L 2710
Patent
active
047957190
ABSTRACT:
A self-aligned split gate single transistor memory cell structure is formed by a process which self aligns the drain region to one edge of a floating gate. The portion of the channel underneath the floating gate is accurately defined by using one edge of the floating gate to align the drain region. The control gate formed over the floating gate controls the portion of the channel region between the floating gate and the source to provide split gate operation. The source region is formed sufficiently far from the floating gate so that the channel length between the source region and the closest edge of the floating gate is controlled by the control gate but does not have to be accurately defined.
REFERENCES:
patent: 4122544 (1978-10-01), McElroy
patent: 4142926 (1979-03-01), Morgan
patent: 4173318 (1979-11-01), Bassous et al.
patent: 4173791 (1979-11-01), Bell
patent: 4247558 (1981-05-01), Guterman
patent: 4257832 (1981-03-01), Schwabe et al.
patent: 4274012 (1981-06-01), Simko
patent: 4297719 (1981-10-01), Hsu
patent: 4318216 (1982-03-01), Hsu
patent: 4334292 (1982-06-01), Eitan
patent: 4336603 (1982-06-01), Kotecha et al.
patent: 4380866 (1983-04-01), Countryman et al.
patent: 4412311 (1983-10-01), Miccoli et al.
patent: 4426764 (1984-01-01), Kosa et al.
patent: 4462090 (1984-07-01), Iizuka
patent: 4471373 (1984-09-01), Shimizu et al.
patent: 4495693 (1985-01-01), Iwahashi et al.
patent: 4561004 (1985-12-01), Kuo
IEEE Transactions, Electron Devices, vol. ED-29, No. 4, Apr. 1982, pp. 611-et seq., "Semiconductor MOSFET Structure for Minimizing Hot Carrier Generation".
IEEE Transactions, Electron Devices/vol. ED-32, No. 3, Mar. 1985, pp. 562-et seq., "Optimum Design of N+-N-Double-Diffused Drain MOSFET to Reduce Hot-Carrier Emission".
Electronics/Aug. 21, 1986, pp. 53-56.
Electronics/Sep. 4, 1986, p. 30.
Electronics/ Mar. 3, 1988, pp. 47-48.
IEE Transactions, Electron Devices/vol. ED-32, No. 5, May 1985, pp. 896-et seq., "Lightly Doped Drain Transistors for Advanced VLSI Circuits".
Gimlan Gideon
Gunnison Forrest E.
Hearn Brian E.
MacPherson Alan H.
Thomas Tom
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