Self aligned silicide process for gate/runner without extra mask

Details Self aligned silicide process for gate/runner without extra mask Self aligned silicide process for gate/runner without extra mask

1991-03-21

1992-02-04

Hearn, Brian E.

Fishing, trapping, and vermin destroying

437 41, 437194, 437228, 437231, 148DIG141, H01L 2128

Patent

active

050860178

ABSTRACT:
A method is described for forming metal silicide contacts to polycrystalline silicon regions and nonmetal silicide contacts to monocrystalline silicon regions of an integrated circuit device. Polycrystalline silicon regions are formed and pattered. A dielectric masking layer is formed over the polycrystalline and monocrystalline silicon regions. The surfaces of the masking layer are covered and the irregularities of the surfaces filled with an organic material to thereby planarize the surfaces. The organic material is blanket etched until the masking layer which covers the polycrystalline silicon regions is exposed and allowing the masking layer which covers the monocrystalline silicon regions to remain covered with organic material. The exposed masking layer is removed from the polycrystalline regions. The remaining organic material is removed. A layer of metal film is blanket deposited over the wafer. The metal silicide contacts to polycrystalline regions are formed. An insulating layer is formed over the surface of the structure. Openings are made in the insulating layer to the monocrystalline regions and the silicide layer on top of the polycrystalline silicon regions. Nonmetal silicide contacts, such as aluminum or tungsten with or without a barrier metal are made to the monocrystalline regions.

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