Self-aligned method for forming contact with zero offset to gate

Fishing – trapping – and vermin destroying

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437241, 437235, H01L 2144

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active

054398460

ABSTRACT:
A method for self-aligned zero-margin contacts to active and poly-1, using silicon nitride or other dielectric material with low reflectivity and etch selectivity to oxide for an etch stop layer and also for sidewall spacers on the gate.

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IBM Technical Disclosure Bulletin, vol. 30, No. 8, Jan. 1988, "Methods of Forming Small Contact Holes".
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IEDM 1987 (Dec. 1987), pp. 358-361, Lau et al. "A Super Self-Aligned Source/Drain MOSFET".
IEDM 1992 (Apr. 1992) pp. 837-840, Fukase et al., "A Margin-Free Contact Process Using Al.sub.2 O.sub.3 Etch-Stop Layer For High Density Devices".
Semiconductor Int'l, Aug. 1993, p. 36, Pete Singer, "A New Technology for Oxide Contact and Via Etch" Pete Singer, Editor.

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