Self-aligned LDD thin-film transistor and method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

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Details

C257S059000, C257S061000, C257S066000, C257S067000, C257S069000, C257S070000, C257S291000

Reexamination Certificate

active

10833487

ABSTRACT:
A self-aligned LDD TFT and a fabrication method thereof. A substrate is provided, on which a semiconductor layer is formed. A first masking layer is provided over a first region of the portion of the semiconductor layer. The first masking layer includes a material that provides a permeable barrier to a dopant. The semiconductor layer including the first region covered by the first masking layer is exposed to the dopant, wherein the first region covered by the first masking layer is lightly doped with the dopant in comparison to a second region not covered by the first masking region.

REFERENCES:
patent: 5292675 (1994-03-01), Codama
patent: 5620905 (1997-04-01), Konuma et al.
patent: 6108056 (2000-08-01), Nakajima et al.
patent: 6114715 (2000-09-01), Hamada
patent: 6115094 (2000-09-01), Fukunaga
patent: 6124604 (2000-09-01), Koyama et al.
patent: 6130119 (2000-10-01), Jinnai
patent: 6274887 (2001-08-01), Yamazaki et al.
patent: 6486496 (2002-11-01), Chang et al.
patent: 6599785 (2003-07-01), Hamada et al.
patent: 6617612 (2003-09-01), Zhang et al.
patent: 6624051 (2003-09-01), Ohtani et al.
patent: 6624477 (2003-09-01), Takemura et al.
patent: 6737306 (2004-05-01), Yamazaki et al.
patent: 6777716 (2004-08-01), Yamazaki et al.
patent: 6952023 (2005-10-01), Yamazaki et al.
patent: 7001801 (2006-02-01), Yamazaki et al.
patent: 2002/0025591 (2002-02-01), Ohnuma et al.
patent: 2002/0041350 (2002-04-01), Yamazaki et al.
patent: 2002/0117736 (2002-08-01), Yamazaki et al.
patent: 2002/0119606 (2002-08-01), Hamada et al.
patent: 2002/0134979 (2002-09-01), Yamazaki et al.
patent: 2002/0179908 (2002-12-01), Arao
patent: 2003/0025127 (2003-02-01), Yanai et al.
patent: 2003/0067004 (2003-04-01), Nakazawa et al.
patent: 2003/0094613 (2003-05-01), Joo et al.
patent: 2003/0231263 (2003-12-01), Kato et al.
patent: 2004/0051142 (2004-03-01), Yamazaki et al.
patent: 2005/0218405 (2005-10-01), Yamazaki et al.
patent: 2005/0237286 (2005-10-01), Tanada
patent: 1452250 (2003-10-01), None
patent: 05-047791 (1993-02-01), None
patent: 06-140421 (1994-05-01), None
patent: 06-333948 (1994-12-01), None
patent: 07-211912 (1995-08-01), None
patent: 2003-023014 (2003-01-01), None
patent: 565724 (2003-12-01), None
patent: 200302372 (2003-08-01), None
Office Action in counterpart Taiwan patent application No. TW 200302372.

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