Selectively configurable probe structures, e.g., selectively...

Details Selectively configurable probe structures, e.g., selectively... Selectively configurable probe structures, e.g., selectively...

2007-01-30

2007-01-30

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

11192147

ABSTRACT:
Microelectronic components are commonly tested with probe cards. Certain aspects of probes, probe cards, and methods of testing microelectronic components are discussed herein. In one specific example, a probe card includes a base and a probe carried by the base. An actuator is associated with the probe and is adapted to selectively position the probe with respect to an electrical contact on the microelectronic component. A test power circuit is coupled to the first probe and adapted to deliver test power to the first probe. In one exemplary method, an actuator is actuated to move the probe from a first probe arrangement to a second probe arrangement.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4757256 (1988-07-01), Whann et al.
patent: 4811246 (1989-03-01), Fitzgerald, Jr. et al.
patent: 4892122 (1990-01-01), Ickes
patent: 5036271 (1991-07-01), Mazur et al.
patent: 5070297 (1991-12-01), Kwon et al.
patent: 5122739 (1992-06-01), Aton
patent: 5184155 (1993-02-01), Yonekubo et al.
patent: 5214389 (1993-05-01), Cao et al.
patent: 5229679 (1993-07-01), Higuchi et al.
patent: 5244534 (1993-09-01), Yu et al.
patent: 5314843 (1994-05-01), Yu et al.
patent: 5357192 (1994-10-01), Van Zee et al.
patent: 5449314 (1995-09-01), Meikle et al.
patent: 5449909 (1995-09-01), Kaiser et al.
patent: 5555422 (1996-09-01), Nakano
patent: 5681423 (1997-10-01), Sandhu et al.
patent: 5739050 (1998-04-01), Farnworth
patent: 5786621 (1998-07-01), Saif et al.
patent: 5815000 (1998-09-01), Farnworth et al.
patent: 5883519 (1999-03-01), Kennedy
patent: 5894218 (1999-04-01), Farnworth et al.
patent: 5923178 (1999-07-01), Higgins et al.
patent: 6018249 (2000-01-01), Akram et al.
patent: 6025728 (2000-02-01), Hembree et al.
patent: 6072323 (2000-06-01), Hembree et al.
patent: 6075373 (2000-06-01), Iino
patent: 6075375 (2000-06-01), Burkhart et al.
patent: 6078186 (2000-06-01), Hembree et al.
patent: 6081429 (2000-06-01), Barrett
patent: 6094058 (2000-07-01), Hembree et al.
patent: 6106351 (2000-08-01), Raina et al.
patent: 6107122 (2000-08-01), Wood et al.
patent: 6150717 (2000-11-01), Wood et al.
patent: 6163956 (2000-12-01), Corisis
patent: 6180525 (2001-01-01), Morgan
patent: 6188232 (2001-02-01), Akram et al.
patent: 6198172 (2001-03-01), King et al.
patent: 6208156 (2001-03-01), Hembree
patent: 6247629 (2001-06-01), Jacobson et al.
patent: 6255833 (2001-07-01), Akram et al.
patent: 6257958 (2001-07-01), Angell et al.
patent: 6285204 (2001-09-01), Farnworth
patent: 6294839 (2001-09-01), Mess et al.
patent: 6310484 (2001-10-01), Akram et al.
patent: 6348809 (2002-02-01), Hirota et al.
patent: 6356098 (2002-03-01), Akram et al.
patent: 6552556 (2003-04-01), Miki
patent: 6924653 (2005-08-01), Schaeffer et al.
patent: 2003/0085721 (2003-05-01), Eldridge et al.
patent: 2005/0024071 (2005-02-01), Schaeffer et al.
patent: 2005/0024072 (2005-02-01), Schaeffer et al.
patent: WO-84/01437 (1994-04-01), None
patent: WO-01/13130 (2001-02-01), None
patent: WO-01/20347 (2001-03-01), None
patent: WO-01/67116 (2002-02-01), None
patent: WO-01/67116 (2002-02-01), None
U.S. Appl. No. 11/133,850, filed May 19, 2005, Schaeffer et al.
Accuprobe, Inc., Z-Adjustable Probes for Wafer Sort and Hybrid Laser Trim, http://www.accuprobe.com/... (accessed Jun. 27, 2002), 5 pages, Copyright 1996-2002, Salem, Massachusetts.
Conrad, James M. and Mills, Jonathan W., “Appendix D: Technical Characteristics of Flexinol Actuator Wires,” (Dynalloy, Inc.),Stiquito™: Advanced Experiments with a Simple and Inexpensive Robot, pp. 301-309, Dec. 1997, IEEE Computer Society Press and John Wiley & Sons, Inc., Los Alamitos, California and Somerset, New Jersey.
Kulicke & Soffa Industries Inc., Ceramic Blades—Probes, http://www.kns.com/prodserv/PDFS/TEST/probecard—blades.pdf, 4 pages. 2001.
Kulicke & Soffa Industries Inc., PCS 600 Probe Cards, http://www.kns.com/prodserv/test-division/pdfs/PCS600.pdf, 2 pages, 2001.
Kulicke & Soffa Industries Inc., Standard Epoxy Cantilever Probe Cards, http://www.kns.com/prodserv/pdfs/test/cantilever.pdf, 4 pages, 2001.

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