Selective threshold voltage verification and compaction

Details Selective threshold voltage verification and compaction Selective threshold voltage verification and compaction

2008-03-04

2009-08-25

Phan, Trong (Department: 2827)

Static information storage and retrieval

Floating gate

Particular connection

C365S185180, C365S185220, C365S185240, C365S185290, C365S185330

Reexamination Certificate

active

07580286

ABSTRACT:
Non-volatile memory devices for providing selective compaction verification and/or selective compaction to facilitate a tightening of the distribution of threshold voltages in memory devices utilizing a NAND architecture. By providing for compaction verification and/or compaction on less than all word lines of a NAND string, increased tightening of the distribution may be achieved over prior methods performed concurrently on all word lines of a NAND string.

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