Multiplex communications – Diagnostic testing – Fault detection
Reexamination Certificate
2005-05-24
2010-12-21
Ferris, Derrick W (Department: 2463)
Multiplex communications
Diagnostic testing
Fault detection
C370S248000
Reexamination Certificate
active
07855969
ABSTRACT:
The present invention is directed to a method and system for testing systems involving high speed SERDES cores by exposing an internal nature of signals. The signals are tapped at various external test points. The present invention may take one or more test points in receive and/or transmit paths of high speed SERDES cores, and expose the test points by routing signals to the pins/balls on a chip. Programmable directing (multiplexing) of signals may be utilized to restrict number of output debug ports. Consequently, the number of the pin count required for the chip may be controlled.
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“SerDes core supports 155Mbps to 3.125Gbps”, EE Times Asia, Dec. 29, 2004.
Robb Bryan
Smith Robert F
Vogel Danny
Cheng Peter
Ferris Derrick W
LSI Corporation
Suiter Swantz pc llo
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