Selective plasma etching and deposition

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

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Details

156 7, 156 8, 156 17, 427 41, 427271, B05D 306

Patent

active

039405060

ABSTRACT:
This invention relates to a method of selectively treating the surface of an article comprising silicon in part and either silica or silicon nitride in part wherein either the silicon or the silicon compound is etched at a greater rate or a fluoropolymer is deposited on the article by placing the article in a plasma containing fluorine, carbon and reducing species and adjusting the concentration of the reducing species to selectively etch the silicon at a greater rate, etch the silicon compound at a greater rate or deposit polymer.

REFERENCES:
patent: 3615956 (1971-10-01), Irving et al.
patent: 3795557 (1974-03-01), Jacob

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