Coded data generation or conversion – Sample and hold
Reexamination Certificate
2006-11-14
2006-11-14
Jeanglaude, Jean Bruner (Department: 2819)
Coded data generation or conversion
Sample and hold
C341S172000
Reexamination Certificate
active
07136000
ABSTRACT:
A track/hold circuit with an offset adjustment that can be used to compensate for offset errors from other parts of the system containing the track/hold circuit. The offset adjustment may be provided by impressing a voltage at an electrode of a capacitor of the track/hold circuit during a hold mode and not impressing the voltage at the capacitor electrode during the track mode. The offset adjustment signal may be generated using an adjustable current source to propagate a current through a resistance that is coupled to the track/hold circuit output node via a capacitor of a voltage capacitive divider circuit during the hold mode. The offset introduced into the track/hold mode output signal can be independent of the voltage stored in the voltage capacitive divider circuit just prior to adding the offset adjustment signal.
REFERENCES:
patent: 4439693 (1984-03-01), Lucas et al.
patent: 4542304 (1985-09-01), Swanson
patent: 4587443 (1986-05-01), van de Plassche
patent: 4779012 (1988-10-01), Moscovici
patent: 5184127 (1993-02-01), Myers
patent: 5440256 (1995-08-01), Erhart et al.
patent: 5734276 (1998-03-01), Abdi et al.
patent: 6016067 (2000-01-01), Vulih et al.
patent: 6028459 (2000-02-01), Birdsall et al.
patent: 6052000 (2000-04-01), Nagaraj
patent: 6384641 (2002-05-01), Kase
patent: 6753727 (2004-06-01), Magoon et al.
patent: 6954168 (2005-10-01), Hoskins
patent: 2005/0207234 (2005-09-01), Baechtold et al.
Rudy J. Van De Plassche et al., “A High-Speed 7 Bit A/D Converter,”IEEE, Dec. 1979 (6 pgs), no date.
Kevin Kattmann et al., “A Technique for Reducing Differential Non-Linearity Errors in Flash A/D Converters,”IEEE, Feb. 14, 1991 (2 pgs).
Klaas Bult et al., “An Embedded 240-mW 10-b 50-MS/s CMOS ADC in 1-mm2”,IEEE, Dec. 1997 (9 pgs), no date.
Opris et al., “A Single-Ended 12b 20MSample/s Self-Calibrating Pipeline A/D Converter,”ISSCC, Feb. 6, 1998 (3 pgs).
D. Fu et al., “Digital Background Calibration of a 10b 40MSample/s Parallel Pipelined ADC,”ISSCC, Feb. 6, 1998 (3 pgs).
K. Dyer et al., “Analog Background Calibration of a 10b 40MSample/s Parallel Pipelined ADC,”ISSCC, Feb. 6, 1998 (3 pgs).
William Ellersick et al., “GAD: A 12-GS/s CMOS 4-bit A/D Converter for an Equalized Multi-Level Link,”Symposium on VLSI Circuits Digest of Technical Papers, 1999 (4 pgs), no month.
Jun Ming et al., “An 8b 80MSample/s Pipelined ADC with Background Calibration,”IEEE, Feb. 7, 2000 (3 pgs).
Kouji Sushihara et al., “A 6b 800MSample/s CMOS A/D Converter,”IEEE, Feb. 9, 2000 (2 pgs).
Krishnaswamy Nagaraj et al., “A Dual-Mode 700-Msamples/s 6-bit 200-Msample/s 7-bit A/D Converter in a 0.25-μm Digital CMOS Process,”IEEE, Dec. 2000 (9 pgs), no date.
Govert Geelen, “A 6b 1.1 GSample/s CMOS A/D Converter,”IEEE, Feb. 6, 2001 (3 pgs).
Robert C. Taft et al., “A 100-MS/s 8-b CMOS Subranging ADC with Sustained Parametric Performance from 3.8 V Down to 2.2 V,”IEEE, Mar. 2001 (8 pgs), no date.
Naoki Kurosawa et al., “Explicit Analysis of Channel Mismatch Effects in Time-Interleaved ADC Systems,”IEEE, Mar. 2001 (11 pgs), no date.
Peter Scholtens et al., “A 6b 1.6GSample/s Flash ADC in 0.18μm CMOS using Averaging Termination,”ISSCC, Feb. 5, 2002 (3 pgs).
Ken Poulton et al., “A 4GSample/s 8b ADC in 0.35μm CMOS,”ISSCC, Feb. 5, 2002 (3 pgs).
Po-Hui Yang et al., “Low-Voltage Pulsewidth Control Loops for SOC Applications,”IEEE, Oct. 2002 (4 pgs), no date.
Shafiq M. Jamal et al., “A 10-b 120-Msample/s Time-Interleaved Analog-to-Digital Converter With Digital Background Calibration,”IEEE, Dec. 2002 (10 pgs), no date.
Ken Poulton et al., “A 20GS/s 8b ADC with a 1MB Memory in 0.18μm CMOS,”IEEE, 2003 (10 pgs), no month.
Xicheng Jiang et al., “A 2GS/s 6b ADC in 0.18μm CMOS,”IEEE, Feb. 12, 2003 (10 pgs).
Robert Taft et al., “A 1.8V 1.6GS/s 8b Self-Calibrating Folding ADC with 7.26 ENOB at Nyquist Frequency,”IEEE, Feb. 17, 2004 (2 pgs).
Robert C. Taft et al., “A 1.8-V 1.6-GSample/s 8-b Self-Calibrating Folding ADC With 7.26 ENOB at Nyquist Frequency,”IEEE, Dec. 2004 (9 pgs), no date.
Ozan E. Erdogan et al., “A 12b Digital-Background-Calibrated Algorithmic ADC with −90dB THD,”IEEE, Feb. 17, 1999 (3 pgs).
Michael Choi et al., “A 6b 1.3GSample/s A/D Converter in 0.35μm CMOS,”ISSCC, Feb. 6, 2001 (3 pgs).
Hidri Ols
Taft Robert Callaghan
Hertzberg Brett A.
Jeanglaude Jean Bruner
Merchant & Gould P,C,
National Semiconductor Corporation
LandOfFree
Selective offset adjustment of a track and hold circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Selective offset adjustment of a track and hold circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Selective offset adjustment of a track and hold circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3679886