Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-10-02
2007-10-02
Sugarman, Scott J. (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
Reexamination Certificate
active
10257415
ABSTRACT:
A method and system are disclosed for measuring and mapping the anterior surface topography of a cornea to determine corneal aberrations and an optimal ablation pattern for refractive and therapeutic surgery of the cornea. The invention stimulates a prospective ablation process with real-time visual feedback accurately portraying results of topographic surface alteration that would occur during an actual ablation procedure, thereby achieving minimal corneal aberrations and optimal image quality.
REFERENCES:
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patent: 5861955 (1999-01-01), Gordon
patent: 5929970 (1999-07-01), Mihashi
Schwiegerling, Jim and Greivenkamp, John E., “Using Corneal Height Maps and Polynomial Decomposition to Determine Corneal Aberrations,” Optometry and Vision Science, vol. 74 (11), Nov. 1997, pp. 906-916.
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Schwiegerling, Jim and Snyder, Robert W., “Corneal Ablation Patterns to Correct for Spherical Aberration in Photorefractive Keratectomy,” J Cateract Refract Surg, vol. 26, Feb. 2000, pp. 214-221.
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MacRae, Scott, et al., “Customized and Low Spherical Aberration Corneal Ablation Design,” Journal of Refractive Surgery, vol. 15, Mar./Apr. 1999, (suppl), S246-S248.
Bende Thomas
Jean Benedikt
Oltrup Theo
Hultquist Steven J.
Intellectual Property / Technology Law
Sugarman Scott J.
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