Selective and blanket chemical vapor deposition of Cu from (.bet

Coating processes – Nonuniform coating – Mask or stencil utilized

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427250, 4272551, 427300, C23C 1404

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active

053587430

ABSTRACT:
In microelectronic manufacture, vertical interconnects in integrated circuits are made by the selective deposition of copper onto SiO.sub.2, which is controlled by reacting the SiO.sub.2 surface with chlorotrimethylsilane or dimethyldichlorosilane. These silanes interact with the surface hydroxyl groups to reduce the number of sites at which (hfac)Cu(VTMS) can adsorb and react, therefore providing selectivity.

REFERENCES:
patent: 5098516 (1992-03-01), Norman et al.
patent: 5100501 (1992-03-01), Blumenthal et al.

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