Selecting multiple settings for an integrated circuit...

Electricity: measuring and testing – Electromechanical switching device – Voltage regulator

Reexamination Certificate

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C341S159000

Reexamination Certificate

active

06894501

ABSTRACT:
A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control signals.

REFERENCES:
patent: 5631941 (1997-05-01), Shou et al.
patent: 6434201 (2002-08-01), Ohno
Japanese Patent Abstract, JP 04-207814.*
IBM Technical Disclosure Bulletin, vol. 14, Issue No. 12, PP. 3828-3830, May 1972.

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