Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-06-28
2008-12-02
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S068000, C702S069000, C702S070000, C702S071000, C702S072000, C702S073000, C702S074000, C702S075000, C702S076000, C324S12100R, C324S076190, C324S076280, C324S076580, C375S226000, C375S227000
Reexamination Certificate
active
07460967
ABSTRACT:
Events discovered by an automatic measurement subsystem in the trace of a DSO are visited using a set of event navigation controls. In a TIME Mode the controls operate to display the first of those events, display the next event after the one currently displayed, display the previous event before the one currently displayed, and, display the last event. In a SEVERITY Mode the controls operate to display the best of those events, display the next best event relative to the one currently displayed, display the next worst event before the one currently displayed, and, display the worst event. The sets of navigation controls may be a mode control menu accompanied by four stylized arrow shaped buttons within a GUI that are clicked on by an operator using a mouse. One set of arrow shaped button can serve both modes, or different sets of buttons can serve each respective mode.
REFERENCES:
patent: 6681191 (2004-01-01), Pickerd et al.
patent: 7110898 (2006-09-01), Montijo et al.
Agilent Technologie,s Inc.
Kundu Sujoy K
Lau Tung S
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