Select devices including an open volume, memory devices and...

Details Select devices including an open volume, memory devices and... Select devices including an open volume, memory devices and...

2011-08-30

2011-08-30

Malsawma, Lex (Department: 2892)

Semiconductor device manufacturing: process

Making passive device

Stacked capacitor

C438S396000, C257SE21008

Reexamination Certificate

active

08008162

ABSTRACT:
Select devices including an open volume that functions as a high bandgap material having a low dielectric constant are disclosed. The open volume may provide a more nonlinear, asymmetric I-V curve and enhanced rectifying behavior in the select devices. The select devices may comprise, for example, a metal-insulator-insulator-metal (MIIM) diode. Various methods may be used to form select devices and memory systems including such select devices. Memory devices and electronic systems include such select devices.

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