Segmented charge limiting test algorithm for electrical componen

Details Segmented charge limiting test algorithm for electrical componen Segmented charge limiting test algorithm for electrical componen

1992-03-16

1993-03-09

Harvey, Jack B.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324158R, 324501, 210310, G01R 3100

Patent

active

051929139

ABSTRACT:
A method of electrically testing an electrical component containing a plurality of networks with at least one node. The method uses segmented, charge limiting testing to charge the nodes and detect shorted or disconnected nodes while preventing accumulated charges in the networks from making uncharged nodes appear charged. The method is well suited for voltage contrast electron beam testing of unpopulated high density multichip modules and interconnect substrates.

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Schmidt et al., "Design and Application of an E-beam Test System for Microwiring Substrates," 34th Electron, Ion and Photon Beams Conference, Munich Germany, May 29-Jun. 1, 1990.

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