Seed and stitch approach to embedded arrays

Boots – shoes – and leggings

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 45, 364300, 364900, 365 51, G06F 15606

Patent

active

047759429

ABSTRACT:
A method, for producing a multi-layer metallization pattern (macro) for a custom sized memory embedded on a masterslice, is disclosed. The memory has "n" addresses and stores "m" bits at each address. Specifically, the memory relies on using macros for a "seed" portion and a "stitch" portion of the memory. The seed portion is a small complete memory. The seed contains all the ancillary support circuitry, e.g. address decoders and true/complement generators, used by the entire embedded memory and a small amount of memory locations, typically having "n" rows each one or two bits wide, with their associated data transfer circuits. A "stitch" is one column of "n" memory locations and the data transfer circuits required to serve these locations. Once the macro for the seed is appropriately positioned on the masterslice, then the stitch macro is replicated as many times as needed in contiguous columns outwardly spaced from and vertically aligned with the seed in order to provide the desired number of bits ("m") in each row of the embedded memory. Vertically aligning all the stitches with the seed ensures that corresponding rowlines located within the seed and in each stitch are joined together.

REFERENCES:
patent: T101804 (1982-05-01), Balyoz et al.
patent: 4233674 (1980-11-01), Russell et al.
patent: 4538183 (1985-08-01), Kanno et al.
patent: 4584653 (1986-04-01), Chih et al.
patent: 4612618 (1986-09-01), Pryor et al.
patent: 4613941 (1986-09-01), Smith et al.
patent: 4627015 (1986-12-01), Stephens
patent: 4668972 (1987-05-01), Sato et al.
patent: 4688072 (1987-08-01), Heath et al.
patent: 4701860 (1987-10-01), Mader
Ohkura et al., "A CMOS Gate Array for Computer Applications", Proceedings of the IEEE International Conference on Computer Design: VLSI in Computers, Nov. 2, 1983, pp. 268-271.
Tanaka et al., "An Integrated Computer Aided Design System for Gate Array Masterslices", IEEE 18th Design Automation Conference, 1981, pp. 812-819.
MacPaint, a Manual for the Apple Macintosh, 1983.
Kessler et al., "Standard Cell VLSI Design: A Tutorial", IEEE Circuits and Devices Magazine, Jan. 1985, pp. 17-34.
Hu et al., "Theory and Concepts of Circuit Layout", VLSI Circuit Layout: Theory and Design, IEEE Press, 1985, pp. 3-18.
Trimberger et al., "Automating Chip Layout", IEEE Spectrum, Jun. 1982, vol. 19, No. 6, pp. 38-45.
Franco et al., "The Cell Design System", IEEE 18th Design Automation Conference, 1981, pp. 240-247.
Reingold et al., "A Heirarchy-Driven Amalgamation of Standard and Macro Cells", IEEE Transactions on Computer-Aided Design, vol. CAD-3, No. 1, Jan. 1984, pp. 3-11.
Donze et al., "Philo-A VLSI Design System", IEEE 19th Design Automation Conference, 1982, pp. 163-169.
Lopez et al., "A Dense Gate Matrix Layout Method for MOS VLSI", IEEE Trans. Electron Devices, vol. ED-27, pp. 1671-1675, Aug. 1980.
P. S. Balasubramanian et al., "Automatic RAM Macro Design System", IBM Technical Disclosure Bulletin, vol. 24, No. 2, Jul. 1981, pp. 950-951.
D. Bursky, "Distinctions Blur Between Gate Arrays and Cells as Digital Technology Evolves, Electronic Design, vol. 33, No. 14, 13 Jun. 1985, pp. 81-86.
A. H. Dansky et al., "TTL Masterslice Cell Designed to Make Efficient Random-Access Memory Macros", IBM Technical Disclosure Bulletin, vol. 22, No. 8A, Jan. 1980, pp. 3230-3232.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Seed and stitch approach to embedded arrays does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Seed and stitch approach to embedded arrays, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Seed and stitch approach to embedded arrays will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2159203

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.