Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-11-13
2007-11-13
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S671000, C340S562000, C382S318000
Reexamination Certificate
active
11544391
ABSTRACT:
Security scanning devices based on electrical tomography, including tomography systems based on the measurement of capacitance (ECT) and electromagnetic tomography (EMT), in combination with knowledge-based image analysis and understanding. Each device includes a sensing head or transducer, sensing electronics, image reconstruction and image analysis microprocessor (either microcontroller, DSP, laptop or desktop PC), a display unit and accompanying software for identifying dangerous materials and items. The security scanning devices enable enhancement of image resolution with ECT and EMT. More sensors, more sensitive circuits and flexible/optimal measurement protocols may be employed for obtaining more independent measurements and enable implementation of data fusion to combine the complementary sensitivity of ECT and EMT to different material properties, while providing architecture to implement image knowledge bases, which may characterize objects, whose image attributes are acquired from multiple sensors.
REFERENCES:
patent: 4796013 (1989-01-01), Yasuda et al.
patent: 6057761 (2000-05-01), Yukl
Hennessey A. Kathleen
Yang Wuqiang
Crutsinger Gerald G.
Konsulteurope Limited Limited Liability Joint Stock Company Unit
Nguyen Vincent Q.
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