Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate
2006-11-07
2006-11-07
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Document pattern analysis or verification
Reexamination Certificate
active
07133124
ABSTRACT:
A structure of a security element for documents provided with a combination of differently reacting or responding security features and functional designs, including conductive, magnetic and diffractive ones, which render it difficult or impossible for counterfeiters to discover the functioning of the security element.
REFERENCES:
patent: 4303307 (1981-12-01), Tureck et al.
patent: 4560445 (1985-12-01), Hoover et al.
patent: 5818019 (1998-10-01), Irwin et al.
Neifeld IP Law PC
Punnoose Roy M.
Toatley , Jr. Gregory J.
WHD Electronische Prueftechnik
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