Secondary-battery life estimation apparatus and method

Details Secondary-battery life estimation apparatus and method Secondary-battery life estimation apparatus and method

2008-09-03

2011-11-15

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C320S132000, C324S429000

Reexamination Certificate

active

08060323

ABSTRACT:
A secondary-battery life estimation apparatus includes: a voltage measuring portion measuring a terminal voltage of a secondary battery to be measured; a first memory storing in advance a terminal voltage V0of a non-degraded secondary battery before the non-degraded secondary battery discharges after fully charged; a second memory which stores in advance a life-estimation data map as a look-up table associating a voltage difference dV between a terminal voltage V of the secondary battery to be measured before the secondary battery to be measured discharges after fully charged and the terminal voltage V0with a residual life of the secondary battery to be measured; and a CPU calculating the voltage difference dV between the terminal voltage V measured by the voltage measuring portion before the secondary battery to be measured discharges after fully charged and the terminal voltage V0stored in the first memory and estimating the residual life of the secondary battery to be measured based on the life-estimation data map stored in the second memory using the voltage difference dV.

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Tsujkawa, Tomonobu et al., “Development of High Performance VRLA Batteries Technology and Management System,” NTT Facilites Research and Development Headquarters, vol. 50, No. 8, pp. 569-575, 2001.
Japanese Notice of Reasons for Rejection, w/ English translation thereof, issued in Japanese Patent Application No. JP 2008-217948 dated Sep. 28, 2010.

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