Second opinion method of pattern recognition error reduction

Details Second opinion method of pattern recognition error reduction Second opinion method of pattern recognition error reduction

1989-06-02

1991-01-22

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

382 30, 382 37, G06K 968

Patent

active

049876040

ABSTRACT:
A method of operating optical pattern recognition apparatus which relies upon second opinions in which stored offset coordinates match one another within a predetermined tolerance to avoid unnecessarily high numbers of rejects, undesirable levels of risk in terms of pattern misalignments, or excessive cycle times in terms of unnecessary looping through different grey level thresholds.

REFERENCES:
patent: 3651495 (1972-02-01), Kiji
patent: 3715724 (1973-02-01), Demonte et al.
patent: 4385322 (1983-05-01), Hubach et al.
patent: 4491962 (1985-01-01), Sakou et al.
patent: 4547800 (1985-10-01), Masaki

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