Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1984-06-27
1986-05-13
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
356237, 350 9626, 128634, G02B 2326, A61B 500
Patent
active
045882940
ABSTRACT:
A searching and measuring endoscope employing two image-transmitting systems in a common housing. One system is fitted with a wide angle, fixed focus objective lens with large depth of field for searching and the other system is fitted with a narrow angle, fixed focus objective lens having a small depth of field and a predetermined working distance and magnification for measuring.
REFERENCES:
patent: 3520587 (1970-07-01), Tasaki
patent: 3561432 (1971-02-01), Yamaki
patent: 3877779 (1975-04-01), Pierse
patent: 4267828 (1981-05-01), Matsuo
McGraw Vincent P.
Strickler R. S.
Turner S. A.
Warner-Lambert Technologies Inc.
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