Seals used for testing on an integrated circuit tester

Details Seals used for testing on an integrated circuit tester Seals used for testing on an integrated circuit tester

2006-11-21

2006-11-21

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

07138811

ABSTRACT:
A system for reducing condensation during testing of an integrated circuit is disclosed. An exemplary embodiment includes two seals which close both ends of an enclosed channel formed when the load board is secured to the device tester. Clean dry air with a pressure greater than that of the environment is feed into the enclosed channel and is trapped because of the seals.

REFERENCES:
patent: 4771234 (1988-09-01), Cook et al.
patent: 6420885 (2002-07-01), Fredrickson
patent: 6703852 (2004-03-01), Feltner

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