Semiconductor device manufacturing: process – Semiconductor substrate dicing
Reexamination Certificate
2006-08-31
2009-02-03
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
C257S620000, C257SE21523
Reexamination Certificate
active
07485549
ABSTRACT:
In mixed-component, mixed-signal, semiconductor devices, selective seal ring isolation from the substrate and its electrical potential is provided in order to segregate noise sensitive circuitry from electrical noise generated by electrically noisy circuitry. Appropriate predetermined sections of such a mixed use chip are isolated from the substrate through a non-ohmic contact with the substrate without compromising reliability of the chip's isolation from scribe region contamination.
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Alter Martin
Mallikarjunaswamy Shekar
Ladas & Parry LLP
Micrel Incorporated
Smith Bradley K
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