Cutting – Other than completely through work thickness or through work... – Scoring
Reexamination Certificate
2006-01-05
2008-08-26
Ashley, Boyer D. (Department: 3724)
Cutting
Other than completely through work thickness or through work...
Scoring
C083S879000, C083S886000, C083S663000, C083S676000
Reexamination Certificate
active
07415916
ABSTRACT:
Particle removal structure is employed with a scribing tool to remove particles from the surface of a semiconductor wafer being scribed and transport the particles to another location.
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Ashley Boyer D.
Flores-Sánchez Omar
Lampe Thomas R.
Micro Processing Technology, Inc.
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