Screening of silicon wafers used in photovoltaics

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen

Reexamination Certificate

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C073S760000, C073S777000, C438S014000

Reexamination Certificate

active

08006566

ABSTRACT:
A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.

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