Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate
2011-08-30
2011-08-30
Noori, Max (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
C073S760000, C073S777000, C438S014000
Reexamination Certificate
active
08006566
ABSTRACT:
A method for screening silicon-based wafers used in the photovoltaic industry is provided herewith.
REFERENCES:
patent: 4846746 (1989-07-01), Prost
patent: 5410162 (1995-04-01), Tigelaar et al.
patent: 5693889 (1997-12-01), Nadolink
patent: 5985678 (1999-11-01), Kiyama
patent: 6103552 (2000-08-01), Lin
patent: 6258524 (2001-07-01), Hirabayashi
patent: 6604853 (2003-08-01), Chao et al.
patent: 6734117 (2004-05-01), Sogard
patent: 6798503 (2004-09-01), Hiramoto et al.
patent: 6807454 (2004-10-01), Wang et al.
patent: 6816251 (2004-11-01), Swan et al.
patent: 6840841 (2005-01-01), Hakomori
patent: 6861268 (2005-03-01), Iwabuchi
patent: 7682858 (2010-03-01), Nagai et al.
patent: 2005/0008218 (2005-01-01), O'Dell et al.
patent: 2005/0066739 (2005-03-01), Gotkis et al.
patent: 2005/0264798 (2005-12-01), Nishiyama et al.
patent: 2005/0282299 (2005-12-01), Kim et al.
patent: 2006/0037941 (2006-02-01), Weng et al.
patent: 2007/0122995 (2007-05-01), Henley et al.
patent: 2008/0305615 (2008-12-01), Ueno et al.
patent: 11351850 (1999-12-01), None
International Search Report, PCT/US06/29765, pp. 1-4.
Mier, Graphics Script Provides Quick Classification of GaAs Wafers, Reed Electronics, Apr. 1, 2000, Reed Elsevier.
Higgs, Non-Destructive Optical Methods for Assessing Defects in Production of Si or SiGe Materials, The European Physical Journal, Feb. 10, 2004, 43-48, vol. 27.
Sheldon Peter
Sopori Bhushan L.
Alliance for Sustainable Energy LLC
Mitchell Cynthia S.
Noori Max
Stolpa John C.
White Paul J.
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