Screening of conductors and contacts on microelectronic devices

Details Screening of conductors and contacts on microelectronic devices Screening of conductors and contacts on microelectronic devices

1994-07-12

1995-09-05

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324537, 437 8, 257 48, G01R 3126

Patent

active

054481791

ABSTRACT:
A method is disclosed for testing or screening metal or polysilicon conductors and contacts on microelectronic devices that it uses a modified design layout for individual logic gates to enable high current density testing of all such elements used in the final functional circuit. The method uses a special metal pattern adding metal conductor paths to enable high current testing of normal conductors and contacts at an intermediate point during fabrication. The metal layer is patterned a second time to remove the high current paths and enable functional operation. This allows burn-in and screen testing to be performed at higher current densities than would otherwise be possible.

REFERENCES:
patent: 3788911 (1974-01-01), Unger
patent: 4760032 (1988-07-01), Turner
patent: 4884122 (1989-11-01), Eichelberger et al.
patent: 5047711 (1991-09-01), Smith et al.
patent: 5130644 (1992-07-01), Ott
patent: 5241266 (1993-08-01), Ahmad et al.
patent: 5279975 (1994-01-01), Devereaux et al.
patent: 5307010 (1994-04-01), Chiu

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