Screening logic circuits for preferred states

Details Screening logic circuits for preferred states Screening logic circuits for preferred states

1989-02-23

1991-06-11

Smith, Jerry

Excavating

371 214, G06F 1100

Patent

active

050238744

ABSTRACT:
A test for screening integrated circuits with weak cells comprises storing a known pattern into the cells, interrupting the power to the cells, and comparing the data in the cells upon power-up with the data originally stored therein. The test may be repeated using the complement of the first pattern. Those devices which retain the stored pattern despite the power interruption may be classified as resistant to upset.

REFERENCES:
patent: 3618030 (1971-11-01), Creasy
patent: 3969618 (1976-07-01), Strubel
patent: 4061908 (1977-12-01), de Jonge
patent: 4418403 (1983-11-01), O'Toole
patent: 4503538 (1985-05-01), Fritz
patent: 4553225 (1985-11-01), Ohe
patent: 4646307 (1987-02-01), Nishimura
patent: 4680762 (1987-07-01), Hardee
patent: 4819237 (1989-04-01), Hamilton

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