Television – Special applications – Object or scene measurement
Patent
1992-03-16
1994-02-01
Britton, Howard W.
Television
Special applications
Object or scene measurement
73105, 356237, 348128, H04N 718
Patent
active
052836428
ABSTRACT:
A scratch measurement system employs a class I or class II laser and digital signal processing in conjunction with a vision system to measure scratch depth. Video data acquired by a vision system is processed to determine threshold values wherein the scratch surface is detected and scratch depth computed. Hard copy graphic results as well as numerical scratch depth measurements are provided on a printer. The unit may be calibrated to a certifiable standard and is provided in a low-cost portable package, suitable for use in manufacturing and repair situations as well as in the laboratory.
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IBM Technical Disclosure Bulletin, Wafer Surface Scratch Detector by A. Dupnock, D. Piscitelli and A. Tong, Sep. 1970.
"Machine Vision Optics Guide", No. 500, Newport Corporation Publication date unknown, pp. 6-8.
"A Perspective on Range Finding Techniques for Computer Vision" by R. A. Jarvis, IEEE Transactions on Pattern Analysis and Machine Intelligence, Mar. 1983, pp. 122-139.
"Optical Three-Dimensional Sensing for Machine Vision" by T. C. Strand, Optical Engineering, Jan./Feb. 1985, pp. 33-40.
Britton Howard W.
The Boeing Company
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