Scrap detector

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

209579, G01N 2163, G01N 2185

Patent

active

050429477

ABSTRACT:
Disclosed is a process and apparatus to analyze metal particles to determine their composition and to generate a sorting signal. The particles are exposed to a pulsed laser beam by which they are partly vaporized to form a plasma so that the particles are cleaned and the cleaned area is subsequently partially vaporized by a pulsed laser beam to form a plasma. The spectral lines of the plasma are inspected for an identification of the composition of the metal particles. The required inspection rate of 30 particles per second can readily be achieved or even exceeded if a defined narrow wavelength range or a defined wavelength is filtered from the total radiation that is emitted by the plasma and the intensities of the filtered partial radiations are related to each other to obtain ratios, which are compared with adjustable limiting values. A sorting signal is derived from the result of said comparison. The inspection rate can be improved in that the partial radiation is subjected to a comparison only for a defined interval of time.

REFERENCES:
patent: 4111556 (1978-09-01), Grisar et al.
patent: 4641968 (1987-02-01), Grandy
patent: 4730922 (1988-03-01), Bach et al.
Applied Spectroscopy, Band 41, Nr. 4, May/Jun. 1987, pp. 572-579, Soc. for Applied Spectroscopy, Frederick, Maryland, U.S.; D. A. Cremers.
Applied Spectroscopy, Band 40, Nr. 4, May/Jun. 1986, pp. 491-494, Soc. for Applied Spectroscopy, Frederick, Maryland, U.S.; J. A. Millard et al.
EOSD Elektro-Optical Systems Design, Band 14, Nr. 10, Oct. 1982, pp. 35-41, Chicago, Illinois, U.S.; T. R. Loree et al.
Navy Technical Disclosure Bulletin, Band 10, Nr. 1, Sep. 1984, pp. 97-101, Arlington, Virginia, U.S.; C. E. Bell et al.
Loree, T. R., Radziemski, L. J.: The Identification of Impurities in Metals by Laser-induced Breakdown Spectroscopy, Proc. Tech. Program-Electro-Opt./Laser Conf. Expo 1081, pp. 28-33.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scrap detector does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scrap detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scrap detector will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1411401

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.