Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
2004-12-03
2008-10-28
Phan, Thai (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
C703S006000, C706S013000, C714S025000
Reexamination Certificate
active
07444271
ABSTRACT:
A test program for a data processing apparatus is produced using a genetic algorithm which mutates instances being ordered lists of program instructions within a population forming the test program. The populations are evaluated using a metric by which the population as a whole is scored for its stimulation of predetermined functional points within the data processing apparatus when a determination is being made as to whether or not a particular instance should be swapped in or out of the population.
REFERENCES:
patent: 5488573 (1996-01-01), Brown et al.
patent: 5708774 (1998-01-01), Boden
patent: 5754760 (1998-05-01), Warfield
patent: 5913064 (1999-06-01), Chen
patent: 6058385 (2000-05-01), Koza et al.
patent: 6810372 (2004-10-01), Unnikrishnan et al.
patent: 6885983 (2005-04-01), Ho et al.
patent: 7007249 (2006-02-01), Ly et al.
patent: 2004/0015791 (2004-01-01), Smith et al.
patent: 2005/0137992 (2005-06-01), Polak
patent: 2005/0166096 (2005-07-01), Yount et al.
patent: 2006/0218512 (2006-09-01), Arslan et al.
patent: 2 397 905 (2004-08-01), None
P. Thevenod-Fosse, “An Experimental Study on Software Structural Testing: Deterministic Versus Random Input Generation” Fault Tolerant Computing Symposium, FTCS-21, Digest of papers, Jun. 1991, pp. 410-417.
M. Bose et al, “A Genetic Approach to Automatic Bias Generation for Biased Random Instruction Generation” Evolutionary Computation 2001, May 2001, pp. 442-448.
M. Bose et al, “Automatic Bias Generation Using Pipeline Instruction State Coverage for Biased Random Instruction Generation” On-Line Testing Workshop 2001, Jul. 2001, pp. 65-71.
Brawn Jonathan William
Craske Simon John
Furbish Eric Jason
ARM Limited
Nixon & Vanderhye P.C.
Phan Thai
LandOfFree
Scoring mechanism for automatically generated test programs does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scoring mechanism for automatically generated test programs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scoring mechanism for automatically generated test programs will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4016340