Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2006-09-26
2006-09-26
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
C356S512000, C356S521000, C250S201900
Reexamination Certificate
active
07113268
ABSTRACT:
An optical field sensing system and an associated method are provided that are tolerant of scintillation. The system includes a wavefront sensor that measures gradients across a wavefront at a first resolution defined by the subapertures of the wavefront sensor. The system also includes an intensity sensor that measures the intensity across the wavefront at a higher resolution. The system further includes a wavefront processor that determines respective phases across the wavefront. In addition to the gradients and the intensity measurements, the wavefront processor may determine the respective phases based also upon the noise affiliated with the measurements. In this regard, the wavefront processor may determine the respective phases across the wavefront at least partially based upon the gradients as adjusted by weights that are based upon the intensity measured by the intensity sensor and are influenced by evidence of scintillation.
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Gerwe David Roderick
Schall Harold Barry
Stone James Preston
Alston & Bird LLP
Nguyen Sang H.
The Boeing Company
Toatley , Jr. Gregory J.
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