Active solid-state devices (e.g. – transistors – solid-state diode – Schottky barrier – In integrated structure
Reexamination Certificate
2011-01-25
2011-01-25
Gurley, Lynne A (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Schottky barrier
In integrated structure
C257S471000, C257S475000, C257SE27068, C257SE27016
Reexamination Certificate
active
07875950
ABSTRACT:
In one embodiment, a semiconductor structure comprises a multi-portioned guard ring that includes a first portion and a second portion formed in a region of semiconductor material. A conductive contact layer forms a first Schottky barrier with the region of semiconductor material. The conductive contact layer overlaps the second portion and forms a second Schottky barrier that has an opposite polarity to the first Schottky barrier. The conductive contact layer does not overlap the first portion, which forms a pn junction with the region of semiconductor material.
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Kuramae Fumika
Tu Shang-hui L.
Gurley Lynne A
Jackson Kevin B.
Semiconductor Components Industries LLC
Yushina Galina
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