Scheme and method for testing Analog-to-Digital converters

Details Scheme and method for testing Analog-to-Digital converters Scheme and method for testing Analog-to-Digital converters

2006-12-26

2006-12-26

Barnie, Rexford (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C341S155000

Reexamination Certificate

active

07154422

ABSTRACT:
The invention provides a test scheme of analog-to-digital converters and method thereof. It comprises: a control circuit, a step-ramp signal generator, a multiplexer, an n+m-bit counter, and a test analyzing circuit, wherein m=1, 2, 3 . . . , based on desired accuracy of the test scheme. A clock pulse is coupled to the n+m-bit counter and a control circuit for regulating duty cycle, amplitude, and frequency. It is also coupled to a step-ramp signal generating circuit for being integrated as a test signal source. Therefore the step-ramp signal can synchronize with the n+m-bit counter, and the output codes are applied to compare with output codes of the n-bit ADCs for completely digitally analyzing ADC's parameters. The step-ramp signal is divided into several segments, each is integrated by the regulated clock signal with different duty cycles, which increases integrating time to compensate leakage currents of the capacitor and improve linearity of the step-ramp signal.

REFERENCES:
patent: 5132685 (1992-07-01), DeWitt et al.
patent: 5305003 (1994-04-01), Han
patent: 5712633 (1998-01-01), Bae
patent: 5854598 (1998-12-01), De Vries et al.
patent: 6333706 (2001-12-01), Cummings et al.
patent: 6339338 (2002-01-01), Eldridge et al.
patent: 6339388 (2002-01-01), Matsumoto
patent: 6567021 (2003-05-01), Burns
patent: 6642870 (2003-11-01), Renovell et al.

Affiliated with

Also associated with

Rating

Scheme and method for testing Analog-to-Digital converters does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scheme and method for testing Analog-to-Digital converters, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scheme and method for testing Analog-to-Digital converters will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3684084