Scheduling diagnostic testing of automated equipment for testing

Details Scheduling diagnostic testing of automated equipment for testing Scheduling diagnostic testing of automated equipment for testing

1997-12-11

2000-05-09

Teska, Kevin J.

G01R 3102

Patent

active

060615079

ABSTRACT:
A method of using a processor-based integrated circuit (IC) tester (12) to automatically invoke diagnostic testing. A diagnostic schedule (30) is user-defined (FIG. 3), and checked by the tester (12) at various times, such as before and after the tester 12 tests an IC lot (FIGS. 6, 7, 8). The schedule (30) has various scheduling parameters that permit diagnostic testing to be scheduled to occur at certain times, at the expiration of intervals, or upon certain events. The schedule (30) also permits different levels of diagnostic testing, each level with its own schedule. The tester (12) is programmed to run an appropriate level of diagnostic testing if more than one level is due to occur.

REFERENCES:
patent: 5589765 (1996-12-01), Ohmart

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