X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1982-10-27
1985-05-21
Smith, Alfred E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378100, G01N 2124, G01N 2320
Patent
active
045190925
ABSTRACT:
The distribution of one or more chemical elements within an object is detected by directing primary x-rays to successive points along a scan path on the object and by analyzing the energies of fluorescent x-rays emitted from the successive points to identify characteristic x-rays of the element. In the preferred form, a moving primary x-ray origin point is established by sweeping an electron beam along a broad target plate in a raster pattern corresponding to the desired scan path on the object. A collimator between the target plate and the object has x-ray transmissive zones alternated with x-ray absorbent zones to assure that primary x-rays from the moving origin point reach only corresponding successive points on the object. High precision with a minimum of structural complication is realized by scanning electronically rather than with a mechanical system.
REFERENCES:
patent: 2730566 (1956-01-01), Bartow et al.
patent: 3925660 (1975-12-01), Albert
patent: 3949229 (1976-04-01), Albert
patent: 3983397 (1976-09-01), Albert
patent: 4032787 (1977-06-01), Albert
patent: 4048496 (1977-09-01), Albert
patent: 4057745 (1977-11-01), Albert
patent: 4104519 (1978-08-01), Oldendorf
patent: 4144457 (1979-03-01), Albert
patent: 4149076 (1979-04-01), Albert
patent: 4196351 (1980-04-01), Albert
patent: 4259582 (1981-03-01), Albert
patent: 4259583 (1981-03-01), Albert
patent: 4288697 (1981-09-01), Albert
patent: 4317036 (1982-02-01), Wang
patent: 4439680 (1984-03-01), Broadhurst
Rolf Woldseth, X-Ray Spectrometry, Chapter 4, pp. 4.1 to 4.17, Published 1973 by Kevex Corp., Foster City, California.
Brochure entitled Model 6110-60 Specifications-TEFA X-Probe Published by EG&G ORTEC, date and author not known.
Brochure entitled The PGT 800-Composition and Thickness Analyzer Published by Princeton Gamma-Tech, date and author not known.
Grigsby T. N.
Smith Alfred E.
LandOfFree
Scanning x-ray spectrometry method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning x-ray spectrometry method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning x-ray spectrometry method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1542892