Scanning X-ray fluorescence analyzer

Details Scanning X-ray fluorescence analyzer Scanning X-ray fluorescence analyzer

1997-03-14

2000-08-29

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378210, G01N 23223

Patent

active

061119296

ABSTRACT:
Disclosed is a scanning x-ray fluorescence spectrometer for measuring accurately the content of a randomly distributed element contained in a sample. Said device comprising a linear excitation source of radioactive material in a holder which produces a beam of ionizing radiation capable of exciting the emission of primary x-rays of the said element from said sample. The sample is mechanically drawn through said beam in a direction perpendicular to the axis of said source, thus exposing the entire sample to a uniform radiation flux. A linear radiation detector is positioned on a plane parallel to said sample and said source, positioned such that its sensitive area faces said sample at the point where the most intense portion of said beam passes through said sample, thus achieving a uniform collection of x-rays from the sample. A personal computer provides calibration, motor control and data analysis capability including an algorithm to convert nuclear data into an accurate reading of the concentration of the element in the sample.

REFERENCES:
patent: 4698832 (1987-10-01), Kuusi
patent: 5274688 (1993-12-01), Grodzins

Affiliated with

Also associated with

Rating

Scanning X-ray fluorescence analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning X-ray fluorescence analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning X-ray fluorescence analyzer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1256535