Scanning type probe microscope

Details Scanning type probe microscope Scanning type probe microscope

1994-03-30

1996-04-09

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

372 31, G01J 132

Patent

active

055064000

ABSTRACT:
In a scanning type probe microscope, a semiconductor laser LD is driven by a current having a value not more than an oscillation threshold value using a constant current circuit for weak light, and weak light is used to perform positional adjustment of the position of the laser beam on a cantilever.

REFERENCES:
patent: 4565197 (1986-01-01), Daly
patent: 5359434 (1994-10-01), Nakao et al.

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