Scanning SQUID microscope with improved spatial resolution

Details Scanning SQUID microscope with improved spatial resolution Scanning SQUID microscope with improved spatial resolution

2006-01-10

2006-01-10

Ledynh, Bot (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetometers

C326S005000, C505S162000

Reexamination Certificate

active

06984977

ABSTRACT:
A scanning SQUID microscope for acquiring spatially resolved images of physical properties of an object includes a SQUID sensor arranged in perpendicular to the plane of the object under investigation for detecting tangential component of the magnetic field generated by the object. During scanning of the SQUID sensor over the object under investigation, the position signal from a position interpreting unit, as well as relevant output signals from the SQUID sensor are processed by a processing unit which derives from the data, spatially resolved images of the physical properties of the object. The specific orientation of the SQUID sensor with respect to the plane of the object permits an enlarged area of the SQUID chip on which the modulation and feedback line can be fabricated in the same technological process with the SQUID sensor. Additionally, larger contact pads afforded provide for lower contact resistance and ease in forming contact with bias and read-out wires.

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