Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2007-09-11
2007-09-11
LeDynh, Bot (Department: 2862)
Electricity: measuring and testing
Magnetic
Magnetometers
C326S005000, C505S162000, C505S846000
Reexamination Certificate
active
11081361
ABSTRACT:
A scanning SQUID microscope is set forth to provide improved output imaging. The SQUID microscope includes a vertically adjustable housing adapted to securely retain a SQUID loop or sensor. A scanning stage of the SQUID microscope is adapted to support a sample while moving the sample along a predetermined path to selectively position predetermined portions of the sample in close proximity to the SQUID loop or sensor to permit the loop or sensor to detect predetermined magnetic field information provided by the predetermined portions of the sample. A position control processor coupled to the scanning stage is operative to receive and process the predetermined magnetic field information to provide corresponding position noise information. Criteria are also presented for determining the expected level of position noise under given experimental conditions.
REFERENCES:
patent: 5523686 (1996-06-01), Kirtley et al.
patent: 6489611 (2002-12-01), Aumond
Su-Young Lee, J. Matthews, F.C. Wellstood; Position noise in scanning superconducting quantum interference device microscopy, Applied Physics Ltrs, vol. 84, No. 24, Jun. 14, 2004.
Lee Su-Young
Matthews John
Wellstood Frederick C.
AFMCLO/JAZ
Klouzinski Robert V.
LeDynh Bot
Moore Jeffrey R.
United States of America as represented by the Secretary of the
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