Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate
2011-05-31
2011-05-31
Nguyen, Tu T (Department: 2886)
Optics: measuring and testing
For optical fiber or waveguide inspection
Reexamination Certificate
active
07952695
ABSTRACT:
A scanning optical spectrometer with a detector array is disclosed, in which position of focused spot of light at the input of a dispersive element such as arrayed waveguide grating (AWG) with a slab input, is scanned using a micro-electro-mechanical (MEMS) tiltable micromirror so as to make the dispersed spectrum of light scan over the detector array coupled to the AWG. Sub-spectra recorded using individual detectors are concatenated by a processor unit to obtain the spectrum of input light.
REFERENCES:
patent: 6656528 (2003-12-01), Ouellet et al.
patent: 7212705 (2007-05-01), Shahar et al.
Crafts Douglas E.
Duggan Philip
Farrell James F.
Fondeur Barthelemy
Ranalli Eliseo
JDS Uniphase Corporation
Nguyen Tu T
Pequignot Matthew A.
Pequignot & Myers LLC
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