Chemical apparatus and process disinfecting – deodorizing – preser – Analyzer – structured indicator – or manipulative laboratory... – Means for analyzing liquid or solid sample
Patent
1994-11-15
1998-03-24
Marschel, Ardin H.
Chemical apparatus and process disinfecting, deodorizing, preser
Analyzer, structured indicator, or manipulative laboratory...
Means for analyzing liquid or solid sample
422 50, 422 69, 422 8201, 435 4, 435 6, 435 71, 435 72, 435501, C12M 134, C12M 140, C12Q 168
Patent
active
057309400
ABSTRACT:
This invention relates to a scanning probe microscope which examines or processes directly the structure of substance surfaces at the molecular or atomic level, and a method for processing molecules using a scanning probe microscope and a method for detecting DNA base arrangement. A scanning probe microscope has a probe approaching or contacting the substance surface to detect a physical quantity between the substance surface and the probe, wherein the physical quantity is what is interacted or chemically reacted between the substance surface and the molecules or atom groups which act as a sensor and are fixed on the probe, scanning at an atomic level of precision. Therefore, surface structure within a microscopic region can be examined or processed at the molecular or atomic level. A method for detecting DNA base arrangement with any one of three or four kinds of probes fixed with any one of four different kinds of molecules interacting four kinds of bases consisting of DNA, by approaching single stranded DNA fixed on a substrate, measuring the force and scanning by an atomic force microscope at an atomic level of precision.
REFERENCES:
patent: 4724318 (1988-02-01), Binnig
patent: 4868396 (1989-09-01), Lindsay
patent: 5144833 (1992-09-01), Amer et al.
patent: 5171992 (1992-12-01), Clabes et al.
patent: 5289004 (1994-02-01), Okada et al.
patent: 5353632 (1994-10-01), Nakagawa
patent: 5363697 (1994-11-01), Nakagawa
Burnham, N. et al; "Measuring the nanomechanical properties and surface forces . . . ", J. Vac. Sci. Techn. A, vol. 7, No. 4 Jul./Aug. 1989 pp. 2906-2913.
Burnham, N. et al; "Probing the Surface Forces of Monolayer Films . . . ", Physical Review Letters, vol. 64, No. 16, Apr. 16, 1990 pp. 1931-1934.
Marschel Ardin H.
Matsushita Electric - Industrial Co., Ltd.
LandOfFree
Scanning probe microscope and molecular processing method using does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning probe microscope and molecular processing method using , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning probe microscope and molecular processing method using will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2286531