Scanning probe microscope and measuring method by means of...

Details Scanning probe microscope and measuring method by means of... Scanning probe microscope and measuring method by means of...

2007-08-07

2007-08-07

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

11088086

ABSTRACT:
A scanning probe microscope is capable of radiating light on a sample without moving the sample from the scanning probe microscope and is capable of measuring the sample while controlling the conditions under which the sample is placed without changing the location of the sample. The scanning probe microscope includes a cantilever having a probe at a distal end thereof, a sample moving device for moving the sample, and a detection unit for detecting deflection of the cantilever using a laser beam. The detection unit is detachably mounted to the scanning probe microscope during measurement of the sample and is detachable from the microscope to enable radiation of the sample with light without changing the location of the sample.

REFERENCES:
patent: 5157251 (1992-10-01), Albrecht et al.
patent: 6138503 (2000-10-01), Ray
patent: 6468599 (2002-10-01), Terada
patent: 6636311 (2003-10-01), Ina et al.
patent: 2004/0083799 (2004-05-01), Markakis et al.

Affiliated with

Also associated with

Rating

Scanning probe microscope and measuring method by means of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning probe microscope and measuring method by means of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning probe microscope and measuring method by means of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3831073