Scanning probe microscope

Details Scanning probe microscope Scanning probe microscope

1997-02-27

1999-08-17

Le, Que T.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

250306, H01J 314

Patent

active

059397152

ABSTRACT:
There is disclosed a scanning probe microscope capable of producing a topographic image and a magnetic image of a surface of a sample in one measurement. The microscope has a probe tip made of a magnetic material. A physical force, such as an atomic force, is exerted between the probe tip and the sample. When this physical force does not act on the probe tip, it vibrates at a first vibrational frequency. Displacements of the probe tip are detected by a photodetector. A topographic information-extracting portion including a voltage-to-current converter, a phase shifter, an FM demodulator, a low-pass filter, and an error amplifier extracts a signal representative of topographic information from the output from the photodetector. A magnetic distribution-extracting portion, including an oscillator and a lock-in amplifier, extracts information about the magnetism of the sample from the output from the photodetector.

REFERENCES:
patent: 5308974 (1994-05-01), Elings et al.
patent: 5465046 (1995-11-01), Campbell et al.
C. Schonenberger et al ., "Separation of magnetic and topographic effects in force microscopy", J. Appl. Phys., 67 (12), Jun. 15, 1990, pp. 7278-7280.

Affiliated with

Also associated with

Rating

Scanning probe microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning probe microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning probe microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-316845